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[News] High‑Accuracy Optical Metrology for AR/VR, Displays and Light Sources from UV to NIR
Instrument Systems presents its new camera system LumiTop X30 AR and a broad range of advanced optical measurement solutions at SPIE AR|VR|MR 2026 and SPIE Photonics West 2026 in San Francisco, USA. At SPIE AR/VR/MR and Photonics West from 17–22 January 2026 in San Francisco, Instrument Systems will showcase its latest high-accuracy measurement systems in optical metrology. A key highlight will be the launch of the new LumiTop X30 AR – an advanced camera system for precise characterization of near-eye displays used in AR glas…

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